Features
- Multi-Mode Scanning Capability
- Wide Resistance Measurement Range
- Capacitance and Leakage Testing
- High Accuracy Test Results
- Large Memory Storage Capacity
Technical Specifications
| Open / Short | 200 Ω to 50 KΩ |
| Instant On-Resistance Test | 50 mΩ to 10 Ω ON |
| Resistance Test (COND) | 50 mΩ to 500 Ω |
| Resistance Measurement (R) | 0.1 Ω to 10 MΩ |
| Capacitance Measurement (C) | 10 pF to 1000 μF |
| Diode Measurement (D) | 0.0 V to 7.0 V |
| Insulation Resistance (I.S) | 1 MΩ to 1000 MΩ |
| DC Leakage Current (IL) | 0.1 μA to 1000 μA |
| High Voltage Leakage Current (IL) | 0.1 mA to 10 mA |
| Basic Accuracy | ±1% |
| Test Scan Mode | Auto / Manual Scan |
| Measurement Speed | 0.1 sec basic value |
| Measuring Frequency / Signal Voltage | 100 to 100 KHz, 1 VAC |
| Low Voltage Measurement Signal | 5 VDC, 50 mA (Accuracy: ±0.5%) |
| High Voltage Leakage Test | 100 to 700 VACS |
| High Voltage Insulation Test | 5 V to 1000 VDC |
| Test Points | 64 pin / 128 pin |
| Memory Device | 512 KB RAM |
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